page_508 < previous page page_508 next page > Page 508 [Control charts] practical issues, 16 Shewhart charts for individuals, 250 short run, 15 special cause chart, 250 widening limits, 240 Correlated data, 240 Cumulative capability curves, 364 D Data cleaning, 376 Duncan's economic model, 105, 133 Dynamical systems, 440 E Empirical Distribution Plots, 380 Employee involvement, 497 Engineering process control, 195 EPC/SPC combined, 194 EPC/SPC performance measures, 203 EWMA, computerized, 231 Experimental design, 273, 306 F Factors and levels, 272 Fixed-effects models, 280 Forecast errors, 243 Fractional factorial design, 130 G Gage losses, 327 Gage variability, 314 General random model, 281 Generalized reduced gradient, 145 Graphical optimization-guard bands, 338 Guard band, 315, 321 H Hierarchical Bayes approach, 63 I IMA(1,1), 217 IMSL FORTRAN subroutines, 166 Integrated moving average, 245 K Kalman filter, 52 L Likelihood ratio scheme, 256 Linear models with guard bands, 332 Lorenzen and Vance model, 106, 126, 163 Losses due to gage error, 315 M Manufacturing strategy, 495 Mis-specification in economic model, 137 Mixed-effects models, 280 Model building, 332 Modified Shewhart algorithm, 225 Monitoring forecast errors, 243 Multiple gage system, 323 N Nelder-Mead algorithm, 166 Numerical optimization-guard bands, 340 O OC Curves, 354 Out-of-control action plan, 96 P Paradigm shifts, 494 Poissonization of regret, 384 Probational sampling, 351 Process action teams, 98 Process capability indices, 410 Process capability study, 425 Process capability, defined, 410 Process modeling, 428 Process performance indices, 427 Q Quality measurement plan (QMP), 372 Quality standards, 371 Quincunx, 441 R Random effects models, 280 Regret concepts, 365 Regret function properties, 369 Reproducibility, 411 Response variable, 272 Responsibility for product quality, 494 Start of Citation[PU]Marcel Dekker, Inc.[/PU][DP]1996[/DP]End of Citation  < previous page page_508 next page >