Force Measurements In A Scanning Force Microscope With Piezoresistive Sensors

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Authorized licensed use limited to: Politechnika Slaska. Downloaded on May 29, 2009 at 04:26 from IEEE Xplore. Restrictions apply.

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Authorized licensed use limited to: Politechnika Slaska. Downloaded on May 29, 2009 at 04:26 from IEEE Xplore. Restrictions apply.

background image

Authorized licensed use limited to: Politechnika Slaska. Downloaded on May 29, 2009 at 04:26 from IEEE Xplore. Restrictions apply.

background image

Authorized licensed use limited to: Politechnika Slaska. Downloaded on May 29, 2009 at 04:26 from IEEE Xplore. Restrictions apply.


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