ni am-nrlil cl::|-i ;i wwHttlyi i- • ?K
Peak profiles show tremendous
sensithdty to size of I diffractmg ciystał J
_ _ _ _ _ _ _ _, _c
IStrongest variation of | Ipeak width is I observed for grain I sizes below 1 Onm
This can be used for determination of size at aceuracy as high as a single atomie piane