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EP-BAM

Brewster Angle Microscopy

„BAM basics"

no reflection !    reflection !

The principle

Reflection ol light from surfaces is part oł our daily experience.

However. an amazing trick of optics is the possibility of having zero reflection. This well-understood phenomenon is described by Brewster's law, providing a unique angle of incidence for the involved optical media.

Any subsequent change of the optical properties at the interface will lead to reflection. This reflected light is the basis of Brewster Angle Microscopy of ultra-thin films.

Brewster Angle Microscopy vs. Imaging Ellipsometry

The EP³-BAM is a specialized version

optical setup Brewster Angle

Microscope

anatyzer

a * Brewster Angle

Upgrading to Imaging

Ellipsometry: by installation of a compensator and speclal software

of an imaging ellipsometer

(see Nanofilm literaturę for details).

It can be upgraded easily to a true imaging ellipsometer. which can still be used as a BAM.

To use as a Brewster Angle Microscope: set the compensator and polartzer to the same angle (0°) which removes the effect ot the compensator

optical setup Imaging Ellipsometer

a variobłe

J

Nanofilm Surface Analysis a division of Halcyonics GmbH Anna-Vandenhoeck-Ring 5 37081 Goettingen

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I Teł.>49(0)551/99960-0 I email: [e-mail] nanofilm I Fax:[phone] I www.nanofilm.de    ^surface analysis