7964527526

1^st School off Materiał Analysii

An ideał introduction to the theory, techniques and applications of XRD, SEM, and TEM

About the School

The school of materiał analysis is intended for students, scientists and eneineers who are related to the field of microscopy and microanalysis. Lectures and tutorials covering the theory and practice of X-ray Diffractometer (XRD), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEKI) are given by experts. Participants will gain a comprehensive lecturers and have the opportunity to hear about the latest research being carried out with the technique.

J&JESW

•    Basic introduction of Crystallography and X-ray Diffraction

•    Quanritative analysis ffom X-ray Diffraction

•    Analysis on poły crystalline sample

JM SEM

• Overview of SEM (Basic and Technique)

• Analysis on Metal, Ceramic, Thin film. Biomateriał and

Composite samplcs

•    Basic introduction of TEM (Imaging, Diffraction pattern, HR-TEM)

•    Sample preparation for metallic by FIB

•    Analysis on bright field, dark field, and high resolution images

•    Analysis on diffraction pattern (single and poły crystal)

[5 Application

Applicants are requested to complete the application form with justification for their attendance. While previous knowledge of materiał analysis is not essential, it is preferred. Prefcrence will also be given to those applicants who also paracipate in 1SFAP 2016.

ate

Wednesday 5 October 2016

Cost

Categories

Local

International

Regular

Student

Rp 1.000.000,-Rp 750.000,-

USD 100 USD 75

®Venue

Research Center for Physics Indonesian Institute of Sciences (LIPI) Kawasan Puspiptek Serpong Bd. 442

^ Further Information

Website: http://situs.opi.lipi.go.id/isfap2016 Email: [e-mail]

Supported

by:

LIPI

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Sponsored

by:

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HITACHI

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