April 2004

Budi Juswardy

1

V80 Camera

Test & Troubleshooting

Training

Budi Juswardy
Singapore Design Centre - MIC Level

3
Personal Communication Sector,

Motorola
DID:        (65) 6486-2761
Fax:         [phone]

E-mail:    

[e-mail]

April 2004

Budi Juswardy

2

V80 Camera

Test

April 2004

Budi Juswardy

3

V80 Camera Test

for

High Volume Mass Production

• DLI TEST

– Data Line Integrity Test (DLI)
– To verify none of the parallel camera data bus lines are

stuck high or low

– To verify none of the parallel camera data bus lines are

shorted together

• Blemish, Noise Line Test

– Blemish Test: Used to detect foreign material or defective

pixels

– Noise Line Test: Used to detect whether there is noise/

lines in the image produced by the camera sensor

April 2004

Budi Juswardy

4

V80 Camera Test

DLI Test

• This built-in test pattern is generated by a “sum of

coordinates” algorithm

• Implemented by combinational logic circuitry in some

imager modules

• DLI Test Algorithm:

– Monitor parallel camera data bus values from test image
– Verify each data bit is low at some point
– Verify each data bit is high at some point
– Verify every possible data bit pair (D0:D1, D0:D2, etc.) is

different (one high & one low) at some point

– Verify every possible data bit pair (D0:D1, D0:D2, etc.) is

not the same during the data analysis for not longer than

90% of the analyzed data. (% can be set)

April 2004

Budi Juswardy

5

• Test will generate a file with the test result/

information

• The format:

• Pass

: 00; Fail: 01

• Matrix

: will compare one line to another line

• High Line

: will pull the line all to high, if pass

will show FF, otherwise it will indicate where

the line shorted to ground

• Low Line

: will pull the line all to low, if pass, will

show FF, otherwise it will indicated where the

line is shorted to Vcc

V80 Camera Test

DLI Test

xx/xx/xx/xx

Low Line

High Line

Matrix

PASS/ FAIL

April 2004

Budi Juswardy

6

V80 Camera Test

DLI Test

•Test Algorithm Detail for 8-bit Bus

Verify each of the following conditions pass for an overall pass
(success) test result

•

D0 = high

•

D1 = high

•

D2 = high

•

D3 = high

•

D4 = high

•

D5 = high

•

D6 = high

•

D7 = high

•

D2 <> D3

•

D2 <> D4

•

D2 <> D5

•

D2 <> D6

•

D2 <> D7

•

D3 <> D4

•

D3 <> D5

•

D3 <> D6

•

D3 <> D7

•

D4 <> D5

•

D4 <> D6

•

D4 <> D7

•

D5 <> D6

•

D5 <> D7

•

D6 <> D7

•

D0 = low

•

D1 = low

•

D2 = low

•

D3 = low

•

D4 = low

•

D5 = low

•

D6 = low

•

D7 = low

•

D0 <> D1

•

D0 <> D2

•

D0 <> D3

•

D0 <> D4

•

D0 <> D5

•

D0 <> D6

•

D0 <> D7

•

D1 <> D2

•

D1 <> D3

•

D1 <> D4

•

D1 <> D5

•

D1 <> D6

•

D1 <> D7

xx

/

xx

/

xx

/

xx

Low Line

High Line

Matrix

(00)

PASS

(01)

FAIL

April 2004

Budi Juswardy

7

V80 Camera Test

DLI Test

• E.g.:

– 00/FF/FF/FF: all pass
– 01/

CF

/FF/FF:

matrix failed

• C

F =

1

D7

1

D6

0

D5

0

D4

1

D3

1

D2

1

D1

1

D0



D4=D5 (shorted)

– 01/FF/

F8

/FF:

high line failed

• F

8

= 1

D7

1

D6

1

D5

1

D4

1

D3

0

D2

0

D1

0

D0



D2=D1=D0 (shorted to gnd)

– 01/FF/FF/

3D

:

low line failed

• 3D

=

0

D7

0

D6

1

D5

1

D4

1

D3

1

D2

0

D1

1

D0



D7=D6=D1 (shorted to Vcc)

April 2004

Budi Juswardy

8

V80 Camera Test

Blemish & Noise Test

• Blemish Test

– Used to detect foreign material or defective pixels
– Due to lens defect/ deformation, dust particle on lens

or the sensor pixel damaged

– (or could be due to the lens cover not removed).

• Noise Line Test

– Used to detect Horizontal Lines in the image
– Horizontal Lines are caused by noisy analog supply

line; OR

– Camera sensor lens defect.

April 2004

Budi Juswardy

9

V80 Camera Test

Blemish & Noise Test

• Requirements for Blemish test:

– NO blemishes

of any size (0x0) is allowed in

Region

1

(R1)

– Not more than 1

of small blemish (1x2) or large

blemish (2x3) is allowed in

Region 2

(R2)

– Fail

if the blemish size is larger than (1x2) size

• Requirement for Noise Line test:

– No horizontal line

noticeable or detectable in the

camera viewfinder

April 2004

Budi Juswardy

10

V80 Camera Test

Blemish & Noise Test

April 2004

Budi Juswardy

11

V80 Camera Test

Blemish & Noise Test

Only one 1x1 in

region 2: PASS

Only one 3x1 in

region 2: PASS

Lots of blemishes

in region 1: FAILED

One large 5x3 in
region 2: FAILED

April 2004

Budi Juswardy

12

V80 Camera Test

Blemish & Noise Test

Only one 1x1 in

region 2: PASS

One large 3x3 in
region 2: FAILED

Horizontal Lines

April 2004

Budi Juswardy

13

Test Setup

1.

Ambient fluorescent lighting sources

2.

Test Chart at 18 to 25 cm distance

3.

Fixture with open nest to locate and align the
UUT

4.

UUT (V80 Phone with camera facing test chart)

5.

CE-Bus to PC

1

2

3

4

5

Side View Of the Test

Fixture

Test Station PC

Test Flow

1.

UUT powers up, enumerates, and is suspended.

2.

Camera viewfinder opened (TST_CAMERA).

3.

Test chart image captured (TST_CAMERA).

4.

Test command (TST_CAMERA, parameter 0x06)
initiates the Data Line Integrity test.

5.

UUT returns Success or Failure response to Test
Station PC.

V80 Camera Test

Blemish & Noise Test

April 2004

Budi Juswardy

14

Camera Test Chart

Blemish

& Noise

Test

Area

Data

Line

Integri

ty

Test

Area

(+10%

)

April 2004

Budi Juswardy

15

V80 Camera

Troubleshooting

April 2004

Budi Juswardy

16

V80 Camera Block Diagram

ATI 2250
Graphics

Accelerator

Baseband

Processor

Serial

VGA

LCD

Display

Control Lines

Data Lines

Image

Sensor

Lens

Cover

Lens

Flash

USB

Test Station PC

via CE Bus

JPEG Encode Only

C-Flex

Front Housing

Blade

Radio

board

PCB

April 2004

Budi Juswardy

17

Camera Test Sequence

•

ENTRY HD2

entry_handler_atlas_CIT_camera

•

GCI1STAT

get_command_interface

Check the CE Bus connector

•

SUS1STAT

suspend_1

Reconnect the CE Bus connector

•

*

backlight_light

•

CAM_EDLI

DLI

Make sure DLI pattern is only 10% on the viewfinder

Check and make sure camera alignment ok

•

DELAY104

Delay1_3_secs

•

CAM_SDLI

DLI

Check the generated error file (slide 5)

•

*

camera_capture_VGA_DLI

•

ECMSTAT

External_camera_image_transfer_status

•

CAM_BLS1

small_blemish_region_1

Check the Blemish image at region 1 (slide 9)

•

CAM_BLL1

large_blemish_region_1

Check the Blemish image at region 1 (slide 9)

•

CAM_BLS2

small_blemish_region_2

Check the Blemish image at region 2 (slide 9)

•

CAM_BLL2

large_blemish_region_2

Check the Blemish image at region 2 (slide 9)

•

CAMBLSTAT

Blemish Test Status

FAIL this section if any of CAM_BL* test fail

Check and make sure camera alignment ok
Remove the lens cover
No dust/ foreign particle or scratch at the lens

•

CAMNUMNL

Camera_no_of_noise_lines

Check the Noise Line image (NL) (slide 12)

•

CAMNLSTA

NL_test_status

FAIL this section if there is Noise Line detected

Check and make sure camera alignment ok
Remove the lens cover
No dust/ foreign particle or scratch at the lens

•

Not available

Not available because log result was not called display in PC.

•

TOF_CMDI

Turn_of

Do not disconnect the USB cable from CE Bus until the test is completed

What to check when camera test fail at

this point.

April 2004

Budi Juswardy

18

Fail DLI Test?

1. Open the backhousing, and check/ make sure the pin-to-pin connector

of camera to the PCB Board is attached properly. RETEST.

2. Replace the camera sensor. RETEST.

Suspect it is either:
a. The B2B pin camera connector problems (see under microscope),
b. The camera flex problem or
c. The image sensor problem.

3. Replace the PCB Board. RETEST.

Suspect it is:
a. B2B of the PCB board to camera is shorted or open circuited
b. B2B of the PCB board to C-flex is shorted/ open.

If problem still exist after 3. :
4. Replace the blade. RETEST.

Suspect it is:
a. C-flex (B2B connector o/c)/ flex open/ shorted
or
b. LCD issue (ATI) BGA crack, LCD B2B connector o/c/ LCD flex open/ shorted

April 2004

Budi Juswardy

19

Fail Blemish Test?

1. Check whether protective plastic for the cover lens has been

removed.

2. Visually check whether the cover lens has foreign material on it.

3. Check whether the camera/ image sensor lens is clean/ clear

from dust.

4. Open the backhousing, and check/ make sure the pin-to-pin

connector of camera to the PCB Board is attached properly

5. Visually check the automated test result/ image generated by

the camera

– Any blemish on region 1?
– Any blemish more than one (1) of the size 2x3 pixel or bigger on

region 2?

• Camera sensor/ image sensor lens defect
• Save the image file with a unique file name for engineering analysis.