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High Pressure and SAS Images
Nanocrystalline materials have very broad and strong SAS profiles and scatter as far as 2©=2~3° (at Cu wavelength). Sometimes taił of smali angle scattering can be seen during “standard” diffraction experiment.
The SAS profiles bring information aboutmicrostructure: ~^«.loose SiC nanocrystalline powder (images on lefthand) during high-pressure high-temperature sintering becomes morę dense (right upper) and finally ceramics r (right lower).
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