Not for reproduction
CISPR/A/WG1(Yamanaka-Sugiura)04-01
Original: English
September 2004
INTERNATIONALS ELECTROTECHNICAL COMMISSION
INTERNATIONAL SPECIAL COMMITTEE
ON RADIO INTERFERENCE (CISPR)
Subcommittee A: RADIO INTERFERENCE MEASUREMENT AND STATISTICAL METHODS
WG1: EMC INSTRUMENTATION SPECIFICATIONS
Subject: Maintenance of CISPR 17
-
Status of the usage of CISPR 17 in the Japanese industry and proposal of its
reorganization -
Reference: CISPR 17 (1981-01): Methods of measurement of the suppression characteristics of
passive radio interference filters and suppression components
1. Introduction
The present CISPR 17 was established in 1981 to specify the insertion loss measurements
mainly for high-power mains filters. At the meeting of CISPR/A/WG1 held in Munich, Germany, on
29 and 30 March 2004, the chairman asked Japanese experts to provide input with respect to the
effectiveness of CISPR 17 and the need of its maintenance [CISPR/A/WG1(Secretary)04-02]. In
response to this request, this document provides a report on the survey made with Japanese EMI
filter manufactures.
2. Current Utilization of CISPR 17 in the Japanese industry
Table 1 shows measurement methods for characterizing various EMI suppression devices that
are currently used in EMI filter industry. EMI filter manufactures employ the CISPR17 insertion
loss measurements on power line filters, but they use other measurement methods for signal line
EMI filters: i.e. impedance measurements and S-parameter measurements.
As a result, the specifications of existing CISPR 17 seem to be still valid for the insertion loss of
EMI suppression filters especially designed for large-current power lines. However, as a tremen-
dous number of small-sized EMI filters are used in various electronic devices, we consider that
the CISPR 17 should be revised to include some new measurement methods for characterizing
various types of modern EMI filters.
3. Other related standards
As far as we know, the related standards for insertion loss measurement are as follows:
[1] MIL-STD-220A:1959, Method of Insertion-loss Measurement.
[2] ANSI C63.13-1991, American National Standard Guide on the Application and Evaluation of
EMI Power-Line Filters for Commercial Use.
[3] IEC 60938-1 Ed. 2.0:1999, Fixed inductors for electromagnetic interference suppression –Part
1:Generic specification
Section 9 (No-Load, 50
Ω
Insertion-Loss Test Methods) of [2] describes CISPR 17 as a reference
document and says “Detailed test methods are given in CISPR 17.” In addition, Section 4.8
(Insertion loss) of [3] states “The measurement method shall be selected from those described in
CISPR 17.”
Judging from these situations, we consider that it is difficult to withdraw the existing CISPR 17.
4. Conclusion (Proposal of reorganization of CISPR17)
The present CISPR 17 is very old but still valid regarding the insertion loss measurements used
for ac power line filters. It is also referred to in some product standards.
However, various electronic devices use innumerable sophisticated EMI suppression filters of
different types such as listed in Table 1. Hence, those filters need to be characterized in author-
ized measurement methods. As there is no standard available, Japanese A/WG1 proposes de-
velopment of the second part of CISPR 17, that is CISPR 17-2, to include new measurement
methods applicable to such EMI suppression devices, while the existing publication should be
maintained as CISPR 17-1.
Table 1 Various EMI suppression devices and applicable measurement methods
CISPR17
Symbol/ Circuit Diagram
Example
Insertion Loss
Impedance
S-
Paramete
Power Line
Filters
Non-
feedthrough
capacitors
and multi-
terminal
FigB-3, B-6, B-
7
Section 5.2.1.1
Feedthrough
capacitors
and LC filters
FigB-2
Section 5.2.1.2
Chokes
FigB-2
Section 5.2.2
Resisters
Section 5.2.3
(ref. CISPR
12, Section
7.1)
Comon
Mode Choke
Coils
○
New Method
Products
Signal Line
Filters
Resisters
○
○
Capacitors
○
○
Inductors/
Beads
○
○
Feedthrough
capacitors
and LC filters
○
Common
Mode Choke
Coils
○
○
Ferrite
Cores/
Absorbing
Clamps
○
○
magentic material
dielectrics